Practical Simulation Methods Considering Characteristic Variations of Wires for CISPR 25 Conducted Emission
H. Sugo, Y. Sarai, B. P. Nayak, H. Muniganti, D. Gope and T. Tsuda, “Practical Simulation Methods Considering Characteristic Variations of Wires for CISPR 25 Conducted Emission,” 2021 IEEE CPMT Symposium Japan (ICSJ), 2021, pp. 78-81, doi: 10.1109/ICSJ52620.2021.9648871.
Black-Box DC-DC Integrated Circuit Modeling towards Design for EMC in Automotive Electronics
N. Ishibashi, L. K. Manepalli, D. Nath, B. P. Nayak, S. Kadam and D. Gope, “Black-Box DC-DC Integrated Circuit Modeling towards Design for EMC in Automotive Electronics,” 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021,pp. 810-814, doi: 10.1109/EMC/SI/PI/EMCEurope52599.2021.9559210.
Study of Radiated Emission from an Automotive Touchscreen System – A Simulation Driven Approach
Anant Devi, Ihor Musijchuk, Debashish. Nath, Sourabh Chasta and Bibhu Nayak, “Study of Radiated Emission from an Automotive Touchscreen System – A Simulation Driven Approach,” 2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), 2021,pp. 1-4, doi: 10.1109/APEMC49932.2021.9596724.
Effect of Cable-bend on CISPR25 CE Current Method
B. P. Nayak, H. Muniganti, H. Sugo, Y. Sarai, T. Tsuda and D. Gope, “Effect of Cable-bend on CISPR25 CE Current Method,” 2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), 2021,, pp. 1-4, doi: 10.1109/APEMC49932.2021.9596715.
Use of Simulation in EMC optimization
Sheshadri, H., Nayak, B. and Kamath, A., 2018, November. Use of Simulation in EMC optimization. In 2018 15th International Conference on ElectroMagnetic Interference & Compatibility (INCEMIC) (pp. 1-4). IEEE.
Circuit models for Bulk Current Injection (BCI) clamps with multiple cables
Nayak, B.P., Das, A., Vedicherla, S.R. and Gope, D., 2018, May. Circuit models for bulk current injection (BCI) clamps with multiple cables. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) (pp. 1160-1163). IEEE.
Hardware-Simulation Correlation of BCI failures in Capacitive Touch Sensing Application using ICIM
Devi, A., Veluri, S.S., Nayak, B.P. and Prabhudesai, S., 2018, November. Hardware-Simulation Correlation of BCI failures in Capacitive Touch Sensing Application using ICIM. In 2018 15th International Conference on ElectroMagnetic Interference & Compatibility (INCEMIC) (pp. 1-4). IEEE.
Diagnosis of Radiating Elements for CISPR 25 RE Test Setup Using Huygens Box Method
Muniganti, H., Nayak, B. and Gope, D., 2020. Diagnosis of Radiating Elements for CISPR 25 RE Test Setup Using Huygens Box Method. IEEE Letters on Electromagnetic Compatibility Practice and Applications, 2(2), pp.40-45.
Model-Based System-Level EMI/EMC Simulation for BCI Pass-Fail Prediction
Nayak, B.P., Ramesh, S., Rajeev, S., Devi, A., Tsuda, T. and Gope, D., 2020. Model-Based System-Level EMI/EMC Simulation for BCI Pass-Fail Prediction. IEEE Letters on Electromagnetic Compatibility Practice and Applications, 2(2), pp.28-33.
